An investigation of Delta-doped field effect transistors

In this work two novel gallium arsenide field effect transistor (FET) structures have been investigated. Both single and double plane delta-doped device layers were grown by molecular beam epitaxy, processed into devices and then D.C. characterized. The simplified analytical D.C. device theory of th...

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Bibliographic Details
Main Author: Nutt, H. C.
Published: Swansea University 1991
Subjects:
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.638344

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