Growth and characterization of bulk GaAs1-xBix/GaAs diodes

To explore the feasibility of utilising gallium arsenide bismide (GaAsBi) as a material for use in solar cells, undoped GaAsBi layers ranging from 50 nm to 350 nm in thickness have been grown by molecular beam epitaxy (MBE) in a p-i-n diode configuration. A growth interrupt technique was employed in...

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Bibliographic Details
Main Author: Hunter, Christopher
Other Authors: David, John
Published: University of Sheffield 2014
Subjects:
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.595275