An image quality model based on the influence of Mura defects in TFT-LCDs

Mura is a type of defect on LCD's that affects image quality. Due to its subtle nature - gradually and non-uniformly changes in lightness within a specific area, how Mura defects can be effectively inspected and objectively graded has been an issue in the LCD manufacturing industry for many yea...

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Bibliographic Details
Main Author: Wei, Guo-Feng
Published: University of Leeds 2012
Subjects:
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.581866