The effects of process variations on performance and robustness of bulk CMOS and SOI implementations of C-elements
Advances in semiconductor technology have been driven by the continuous demands of market forces for IC products with higher performance and greater functionality per unit area. To date industry has addressed these demands, principally, by scaling down device dimensions. However, several unintended...
Main Author: | |
---|---|
Published: |
University of Newcastle Upon Tyne
2011
|
Subjects: | |
Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.556031 |