A study of focussed ion beam patterned thin magnetic films with soft X-ray and magneto-optical microscopy
Until the last few years, focussed ion beam systems were primarily used within the semiconductor industry as tools for modifying prototype integrated circuits, but owing to the development of commercial systems and the concomitant reduction in costs, they are rapidly becoming more popular within aca...
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University of Salford
2010
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.521608 |