Design techniques for low power on-chip error correction
As integrated circuit density increases, digital circuits characterized by high operating frequencies and low voltage levels will be increasingly susceptible to faults. Furthermore, it has recently been shown that for many digital signature and identification schemes an attacker can inject faults in...
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University of Bristol
2008
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.492442 |