Photoelectron spectroscopy of ultra-thin metallic layers
Photoelectron spectroscopy, with LEED, Auger electron spectroscopy (AES) and secondary electron emission crystal current (SEECC) measurements, has been used to investigate the electronic structure of well-characterized overlayers of Tl, Cr, Mn and Fe on Ag(100) and Fe on Cu(100). The Stranski-Krasta...
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University of Leicester
1987
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379207 |