Growth and characterisation of anodic oxide and sulphide films on Cdâ†xHgâ†1â†-â†xTe (CMT) using in-situ ellipsometry and surface second harmonic generation

Growth and characterisation of anodic oxide and sulphide films on Cdâ†xHgâ†1â†-â†xTe (CMT) using in-situ ellipsometry and surface second harmonic generation

Bibliographic Details
Main Author:	Wark, Alastair William
Published:	University of Strathclyde 2000
Subjects:	541 Optical properties
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.367048

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