Growth and characterisation of anodic oxide and sulphide films on Cd←xHg←1←-←xTe (CMT) using in-situ ellipsometry and surface second harmonic generation

Bibliographic Details
Main Author: Wark, Alastair William
Published: University of Strathclyde 2000
Subjects:
541
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.367048