Growth and characterisation of anodic oxide and sulphide films on Cdâ†xHgâ†1â†-â†xTe (CMT) using in-situ ellipsometry and surface second harmonic generation

Bibliographic Details
Main Author:	Wark, Alastair William
Published:	University of Strathclyde 2000
Subjects:	541 Optical properties
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.367048

id	ndltd-bl.uk-oai-ethos.bl.uk-367048
record_format	oai_dc
spelling	ndltd-bl.uk-oai-ethos.bl.uk-3670482015-03-19T08:08:38ZGrowth and characterisation of anodic oxide and sulphide films on Cdâ†xHgâ†1â†-â†xTe (CMT) using in-situ ellipsometry and surface second harmonic generationWark, Alastair William2000541Optical propertiesUniversity of Strathclydehttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.367048Electronic Thesis or Dissertation
collection	NDLTD
sources	NDLTD
topic	541 Optical properties
spellingShingle	541 Optical properties Wark, Alastair William Growth and characterisation of anodic oxide and sulphide films on Cdâ†xHgâ†1â†-â†xTe (CMT) using in-situ ellipsometry and surface second harmonic generation
author	Wark, Alastair William
author_facet	Wark, Alastair William
author_sort	Wark, Alastair William
title	Growth and characterisation of anodic oxide and sulphide films on Cdâ†xHgâ†1â†-â†xTe (CMT) using in-situ ellipsometry and surface second harmonic generation
title_short	Growth and characterisation of anodic oxide and sulphide films on Cdâ†xHgâ†1â†-â†xTe (CMT) using in-situ ellipsometry and surface second harmonic generation
title_full	Growth and characterisation of anodic oxide and sulphide films on Cdâ†xHgâ†1â†-â†xTe (CMT) using in-situ ellipsometry and surface second harmonic generation
title_fullStr	Growth and characterisation of anodic oxide and sulphide films on Cdâ†xHgâ†1â†-â†xTe (CMT) using in-situ ellipsometry and surface second harmonic generation
title_full_unstemmed	Growth and characterisation of anodic oxide and sulphide films on Cdâ†xHgâ†1â†-â†xTe (CMT) using in-situ ellipsometry and surface second harmonic generation
title_sort	growth and characterisation of anodic oxide and sulphide films on cdâ†xhgâ†1â†-â†xte (cmt) using in-situ ellipsometry and surface second harmonic generation
publisher	University of Strathclyde
publishDate	2000
url	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.367048
work_keys_str_mv	AT warkalastairwilliam growthandcharacterisationofanodicoxideandsulphidefilmsoncdaxhga1aaxtecmtusinginsituellipsometryandsurfacesecondharmonicgeneration
_version_	1716761619696975872

Growth and characterisation of anodic oxide and sulphide films on Cdâ†xHgâ†1â†-â†xTe (CMT) using in-situ ellipsometry and surface second harmonic generation

Similar Items

Growth and characterisation of anodic oxide and sulphide films on Cdâ†xHgâ†1â†-â†xTe (CMT) using in-situ ellipsometry and surface second harmonic generation