X-ray scattering studies of compound semiconductors
In this thesis, techniques of high resolution x-ray diffraction, topography and grazing incidence reflectivity have been employed in order to gain information on compound semiconductors. A recent growth technique. Vertical Gradient Freeze (VGF), has been investigated for 2" InP wafers, and been...
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Durham University
1997
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.338012 |