Thin film structural determination and surface analysis
A combined approach to the use of surface analysis techniques and X-ray diffraction has been introduced. In particular the development of the microstructure of UHV evaporated thin metallic films has been investigated with a view to clarifying influences on microstructure (particularly texture). This...
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University of Aberdeen
1996
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.320771 |