The structure and optical properties of amorphous oxide films
The structure and optical bandgap properties of amorphous oxide films are studied by reference to the specific examples of r.f.-sputtered ternary a-Cex Siy Oz and binary a-SiOx : Hy thin films. Atomic structure is investigated by IR, EXAFS and Urbach edge measurements, while the bandgaps are determi...
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University of Leicester
1990
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.306537 |