Gas effects on the interface state spectrum of MIS devices
A semiautomatic measurement system has been developed for investigating the electronic structure of the interface between an insulator and a semiconductor. The associated microcomputer possesses advanced software which leads to simple operation particularly when used in the real time mode. An attrac...
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Durham University
1980
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.277525 |