The quantification of SIMS depth profiles by Maximum Entropy reconstruction
The quantification procedures applied to raw SIMS data were devised on the basis of a simple model for the sputtering and ionisation that occur during measurement. The model and the associated quantification procedures have long been known to be inaccurate. If SIMS is to remain a useful analysis too...
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University of Warwick
1994
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.238841 |