Pre-Silicon Analysis of a Single Event Transient Pulse Measurement Test Structure in a FinFET Process

Pre-Silicon Analysis of a Single Event Transient Pulse Measurement Test Structure in a FinFET Process

abstract: A Single Event Transient (SET) is a transient voltage pulse induced by an ionizing radiation particle striking a combinational logic node in a circuit. The probability of a storage element capturing the transient pulse depends on the width of the pulse. Measuring the rate of occurrence and...

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Bibliographic Details
Other Authors: Shreedharan, Sanjay (Author)
Format: Dissertation
Language:English
Published: 2020
Subjects:
Computer engineering
Electrical engineering
SET Pulse Width Measurement
SET Test Structure
Vernier Chain
Online Access:http://hdl.handle.net/2286/R.I.62784

Internet

http://hdl.handle.net/2286/R.I.62784

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