Evaluation of Compound Semiconductors for Infrared Photo-Detection Applications

Evaluation of Compound Semiconductors for Infrared Photo-Detection Applications

abstract: In this dissertation research, conventional and aberration-corrected (AC) transmission electron microscopy (TEM) techniques were used to evaluate the structural and compositional properties of thin-film semiconductor compounds/alloys grown by molecular beam epitaxy for infrared photo-detec...

Full description

Bibliographic Details
Other Authors: Lu, Jing (Author)
Format: Doctoral Thesis
Language:English
Published: 2017
Subjects:
Materials Science
Engineering
Nanoscience
extended defects
infrared photon detector
interface abruptness
scanning transmission electron microscopy
spectrum imaging
transmission electron microscopy
Online Access:http://hdl.handle.net/2286/R.I.44103

Internet

http://hdl.handle.net/2286/R.I.44103

Similar Items