InCheck - An Integrated Recovery Methodology for Fine-grained Soft-Error Detection Schemes
abstract: Soft errors are considered as a key reliability challenge for sub-nano scale transistors. An ideal solution for such a challenge should ultimately eliminate the effect of soft errors from the microprocessor. While forward recovery techniques achieve fast recovery from errors by simply voti...
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| Format: | Dissertation |
| Language: | English |
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2016
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| Online Access: | http://hdl.handle.net/2286/R.I.40720 |