Characterization of Oxide Thin Films and Interfaces Using Transmission Electron Microscopy

Characterization of Oxide Thin Films and Interfaces Using Transmission Electron Microscopy

abstract: Multifunctional oxide thin-films grown on silicon and several oxide substrates have been characterized using High Resolution (Scanning) Transmission Electron Microscopy (HRTEM), Energy-Dispersive X-ray Spectroscopy (EDX), and Electron Energy-Loss Spectroscopy (EELS). Oxide thin films grown...

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Bibliographic Details
Other Authors: Dhamdhere, Ajit R. (Author)
Format: Doctoral Thesis
Language:English
Published: 2015
Subjects:
Physics
Condensed matter physics
Materials Science
Interfaces
Oxides
TEM
Thin-films
Online Access:http://hdl.handle.net/2286/R.I.36463

Internet

http://hdl.handle.net/2286/R.I.36463

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