Low-Overhead Built-In Self-Test for Advanced RF Transceiver Architectures

Low-Overhead Built-In Self-Test for Advanced RF Transceiver Architectures

abstract: Due to high level of integration in RF System on Chip (SOC), the test access points are limited to the baseband and RF inputs/outputs of the system. This limited access poses a big challenge particularly for advanced RF architectures where calibration of internal parameters is necessary an...

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Bibliographic Details
Other Authors: Jeong, Jae Woong (Author)
Format: Doctoral Thesis
Language:English
Published: 2015
Subjects:
Electrical engineering
Built-In Self-Test
RF Transceiver
Online Access:http://hdl.handle.net/2286/R.I.36447

Internet

http://hdl.handle.net/2286/R.I.36447

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