Improving the Reliability of NAND Flash, Phase-change RAM and Spin-torque Transfer RAM
abstract: Non-volatile memories (NVM) are widely used in modern electronic devices due to their non-volatility, low static power consumption and high storage density. While Flash memories are the dominant NVM technology, resistive memories such as phase change access memory (PRAM) and spin torque tr...
Other Authors: | Yang, Chengen (Author) |
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Format: | Doctoral Thesis |
Language: | English |
Published: |
2014
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Subjects: | |
Online Access: | http://hdl.handle.net/2286/R.I.24802 |
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