Improving the Reliability of NAND Flash, Phase-change RAM and Spin-torque Transfer RAM

abstract: Non-volatile memories (NVM) are widely used in modern electronic devices due to their non-volatility, low static power consumption and high storage density. While Flash memories are the dominant NVM technology, resistive memories such as phase change access memory (PRAM) and spin torque tr...

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Bibliographic Details
Other Authors: Yang, Chengen (Author)
Format: Doctoral Thesis
Language:English
Published: 2014
Subjects:
Online Access:http://hdl.handle.net/2286/R.I.24802

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