Functional Materials characterizations by Scanning/Transmission Electron Microscopy and Electron Energy Loss spectroscopy
abstract: ABSTRACT Along with the fast development of science and technology, the studied materials are becoming more complicated and smaller. All these achievements have advanced with the fast development of powerful tools currently, such as Scanning electron microscopy (SEM), Focused Ion Beam (FIB...
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| Format: | Doctoral Thesis |
| Language: | English |
| Published: |
2013
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| Online Access: | http://hdl.handle.net/2286/R.I.18023 |