Efficient Test Strategies for Analog/RF Circuits

Efficient Test Strategies for Analog/RF Circuits

abstract: Test cost has become a significant portion of device cost and a bottleneck in high volume manufacturing. Increasing integration density and shrinking feature sizes increased test time/cost and reduce observability. Test engineers have to put a tremendous effort in order to maintain test co...

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Bibliographic Details
Other Authors: Yilmaz, Ender (Author)
Format: Doctoral Thesis
Language:English
Published: 2012
Subjects:
Electrical engineering
Adaptive Test
Analog Test
BIST EVM
Quality Aware Test
Online Access:http://hdl.handle.net/2286/R.I.15976

Internet

http://hdl.handle.net/2286/R.I.15976

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