Model Agnostic Extreme Sub-pixel Visual Measurement and Optimal Characterization

Model Agnostic Extreme Sub-pixel Visual Measurement and Optimal Characterization

abstract: It is possible in a properly controlled environment, such as industrial metrology, to make significant headway into the non-industrial constraints on image-based position measurement using the techniques of image registration and achieve repeatable feature measurements on the order of 0.3%...

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Bibliographic Details
Other Authors: Munroe, Michael R. (Author)
Format: Dissertation
Language:English
Published: 2012
Subjects:
Mechanical engineering
Compressed Sensing
Inverse Modeling
Kalman Filtering
Photogrammetry
Subpixel Metrology
System Identification
Online Access:http://hdl.handle.net/2286/R.I.15110

Internet

http://hdl.handle.net/2286/R.I.15110

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