Built-in-Self Test of Transmitter I/Q Mismatch and Nonlinearities Using Self-Mixing Envelope Detector

Built-in-Self Test of Transmitter I/Q Mismatch and Nonlinearities Using Self-Mixing Envelope Detector

abstract: Built-in-Self-Test (BiST) for transmitters is a desirable choice since it eliminates the reliance on expensive instrumentation to do RF signal analysis. Existing on-chip resources, such as power or envelope detectors, or small additional circuitry can be used for BiST purposes. However, du...

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Bibliographic Details
Other Authors: Byregowda, Srinath (Author)
Format: Dissertation
Language:English
Published: 2012
Subjects:
Electrical engineering
BiST
Built in Self test
IIP3
I/Q mismatch
Nonlinearities
Online Access:http://hdl.handle.net/2286/R.I.15094

Internet

http://hdl.handle.net/2286/R.I.15094

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