Tip Induced Quenching Imaging: Topographic and Optical Resolutions in the Nanometer Range

abstract: In this work, atomic force microscopy (AFM) and time resolved confocal fluorescence microscopy are combined to create a microscopy technique which allows for nanometer resolution topographic and fluorescence imaging. This technique can be applied to any sample which can be immobilized on a...

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Bibliographic Details
Other Authors: Schulz, Olaf (Author)
Format: Doctoral Thesis
Language:English
Published: 2012
Subjects:
AFM
Online Access:http://hdl.handle.net/2286/R.I.14820