Potential Induced Degradation (PID) Study of Fresh and Accelerated Stress Tested Photovoltaic Modules

Potential Induced Degradation (PID) Study of Fresh and Accelerated Stress Tested Photovoltaic Modules

abstract: Infant mortality rate of field deployed photovoltaic (PV) modules may be expected to be higher than that estimated by standard qualification tests. The reason for increased failure rates may be attributed to the high system voltages. High voltages (HV) in grid connected modules induce addi...

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Bibliographic Details
Other Authors: Goranti, Sandhya (Author)
Format: Dissertation
Language:English
Published: 2011
Subjects:
Alternative energy
High Voltage Stress
Photovoltaics Reliability
Potential Induced Degradation
PV Characterization and Testing
PV quality and reliability
Online Access:http://hdl.handle.net/2286/R.I.14428

Internet

http://hdl.handle.net/2286/R.I.14428

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