A scanning grating technique for measurement of submicron focused spots
Many applications in optical research require the use of diffraction limited point images with reduced spot sizes. The instrumentation that evaluates these small diameter images must have high resolution (sub-micron) capabilities. One method used to measure sub-micron optical point images is a scann...
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| Language: | en_US |
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The University of Arizona.
1988
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| Online Access: | http://hdl.handle.net/10150/291569 |