IC defect detection using color information and image processing
Most current commercial automated IC inspection systems use gray-level or binary images for IC defect detection in spite of the fact that color permits defect detection where gray-level information is insufficient. Three color image processing techniques including the spectral-spatial clustering, pr...
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| Language: | en_US |
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The University of Arizona.
1988
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| Online Access: | http://hdl.handle.net/10150/276831 http://arizona.openrepository.com/arizona/handle/10150/276831 |