Lithography Using an Atomic Force Microscope and Ionic Self-assembled Multilayers
This thesis presents work done investigating methods for constructing patterns on the nanometer scale. Various methods of nanolithography using atomic force microscopes (AFMs) are investigated. The use of AFMs beyond their imaging capabilities is demonstrated in various experiments involving nanogra...
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Virginia Tech
2016
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| Online Access: | http://hdl.handle.net/10919/72856 |