Concurrent detection of transient faults in microprocessors
A large number of errors in digital systems are due to the presence of transient faults. This is especially true of microprocessor-based systems working in a radiation environment that experience transient faults due to single event upsets. These upsets cause a temporary change in the state of the s...
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| Format: | Others |
| Language: | en_US |
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Virginia Polytechnic Institute and State University
2015
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| Online Access: | http://hdl.handle.net/10919/54212 |