A simulation model for stress measurements in notched test specimens by x-ray diffraction
<p>An analytical model was developed to simulate the stress state of notched tensile specimens. Actual experiments are being carried out by other investigators to study the relaxation of residual stresses in specimens containing stress raisers. In the present work, the stress state develope...
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| Format: | Others |
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Virginia Tech
2014
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| Online Access: | http://hdl.handle.net/10919/45887 http://scholar.lib.vt.edu/theses/available/etd-11202012-040038/ |