Hierarchical test generation for VHDL behavioral models
In this thesis, several techniques for the test generation of VHDL behavioral models are proposed. An algorithm called HBTG, Hierarchical Behavioral Test Generator, is developed and implemented to systematically generate tests for VHDL behavioral models. HBTG accepts the Process Model Graph and the...
Main Author: | Pan, Bi-Yu |
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Other Authors: | Electrical Engineering |
Format: | Others |
Language: | en |
Published: |
Virginia Tech
2014
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Subjects: | |
Online Access: | http://hdl.handle.net/10919/44559 http://scholar.lib.vt.edu/theses/available/etd-09052009-040449/ |
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