Experimental results on aliasing errors in circular BIST design
<p>The circular BIST design is a technique in which the existing circuit is modified, so that the processes of test generation and response compaction are carried out by the circuit being tested itself. Most response compaction techniques suffer from loss of information, known as aliasing. Ali...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en |
| Published: |
Virginia Tech
2014
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10919/42137 http://scholar.lib.vt.edu/theses/available/etd-04182009-041213/ |