Emerging Power-Gating Techniques for Low Power Digital Circuits

Emerging Power-Gating Techniques for Low Power Digital Circuits

As transistor sizes scale down and levels of integration increase, leakage power has become a critical problem in modern low-power microprocessors. This is especially true for ultra-low-voltage (ULV) circuits, where high levels of leakage force designers to chose relatively high threshold voltages,...

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Bibliographic Details
Main Author: Henry, Michael B.
Other Authors: Electrical and Computer Engineering
Format: Others
Published: Virginia Tech 2014
Subjects:
Sense-Amplifier Pass Transistor Logic
NEMS
Digital Electronics
Power-Gating
Low Power
Online Access:http://hdl.handle.net/10919/29627
http://scholar.lib.vt.edu/theses/available/etd-11162011-152427/

Internet

http://hdl.handle.net/10919/29627
http://scholar.lib.vt.edu/theses/available/etd-11162011-152427/

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