Investigation of Non-DLVO Forces using an Evanescent Wave Atomic Force Microscope

Investigation of Non-DLVO Forces using an Evanescent Wave Atomic Force Microscope

This dissertation describes new methods for measuring surface forces using evanescent waves, and applications to non-DLVO forces. An evanescent wave, generated at a solid-liquid interface, is scattered by AFM tips or particles attached to AFM cantilevers. The scattering of this wave is used to det...

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Bibliographic Details
Main Author: McKee, Clayton T.
Other Authors: Chemistry
Format: Others
Published: Virginia Tech 2014
Subjects:
EW-AFM
thin film refractive index
evanescent wave scattering
AFM
steric force
hydration force
hydrophobic force
Online Access:http://hdl.handle.net/10919/28233
http://scholar.lib.vt.edu/theses/available/etd-07092006-234028/

Internet

http://hdl.handle.net/10919/28233
http://scholar.lib.vt.edu/theses/available/etd-07092006-234028/

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