A Statistical and Circuit Based Technique for Counterfeit Detection in Existing ICs
Counterfeit Integrated Circuits (ICs) are previously used ICs that are resold as new. They have become a serious problem in modern electronic devices. They cause lower performance, reduced life span and even catastrophic failure of systems and platforms. To prevent counterfeiting and the associated...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Others |
| Published: |
Virginia Tech
2013
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10919/23177 |