Characterization of nanocrystal-based photovoltaics: electron microscopy & electron beam-induced current via scanning electron microscopy
The work presented here is the first of its kind where nanocrystal-based photovoltaics are characterized by directly imaging the electronic properties and correlating them to the structure of the sample. Through electron beam-induced current (EBIC), a finite beam of high energy electrons mimics phot...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2014
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-12112014-141358/ |