Single Event Upset Mechanisms for Low - Energy - Deposition Events in SiGe HBTs

Silicon Germanium (SiGe) Heterojunction Bipolar Transistors (HBTs) are a new candidate technology for space applications due to their superior performance to traditional bipolar transistors and tolerance of total ionizing dose (TID) and displacement effects from space radiation. However, SiGe HBTS a...

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Bibliographic Details
Main Author: Montes, Enrique Jose
Other Authors: Dr. Ronald D. Schrimpf
Format: Others
Language:en
Published: VANDERBILT 2007
Subjects:
Online Access:http://etd.library.vanderbilt.edu/available/etd-12072007-180707/