The Radiation Response and Long Term Reliability of High-k gate dielectrics

The Radiation Response and Long Term Reliability of High-k gate dielectrics

The radiation response and long term reliability of alternative gate dielectrics will play a critical role in determining the viability of these materials for use in future space applications. The total dose radiation responses of several near and long term alternative gate dielectrics to silicon di...

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Bibliographic Details
Main Author:	Felix, James Andrew
Other Authors:	Sankaren Mahadevan
Format:	Others
Language:	en
Published:	VANDERBILT 2003
Subjects:	Electrical Engineering
Online Access:	http://etd.library.vanderbilt.edu/available/etd-12032003-143515/

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