The Radiation Response and Long Term Reliability of High-k gate dielectrics
The radiation response and long term reliability of alternative gate dielectrics will play a critical role in determining the viability of these materials for use in future space applications. The total dose radiation responses of several near and long term alternative gate dielectrics to silicon di...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2003
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-12032003-143515/ |