Single Event Latchup in a Deep Submicron CMOS Technology
Single event latchup (SEL) has been observed on a range of different devices over the past three decades and can result in large currents on metal interconnects, resulting in long-term device reliability issues or catastrophic failure. Because of this, it is important to thoroughly screen parts for...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2008
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-11192008-010832/ |