Single-Event Multiple-Transient Characterization and Mitigation via Standard Cell Placement Methods
The effects of radiation on the operation of integrated circuits (IC) continue to take a more important role as technology feature sizes scale down, critical charge decreases, and operating frequencies increase. In space and other harsh environments, single ion strikes are more likely to affect mult...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2016
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-09282016-101105/ |