Characterization of the Two-Photon Absorption Carrier Generation Region in Silicon Diodes
Two-photon absorption (TPA) has become an important tool for understanding the mechanisms of single-event effects (SEE) in microelectronics. Very little experimental work has been reported that describes the physical structure of the charge cloud centered on the focal plane where TPA carrier generat...
Main Author: | Hooten, Nicholas C |
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Other Authors: | Ronald Schrimpf |
Format: | Others |
Language: | en |
Published: |
VANDERBILT
2011
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Subjects: | |
Online Access: | http://etd.library.vanderbilt.edu/available/etd-07222011-143800/ |
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