ELECTRO-THERMAL SIMULATION STUDIES OF SINGLE-EVENT BURNOUT IN POWER DIODES
Single-event burnout in power diodes is studied using coupled electro-thermal simulations. A two-dimensional rectangular diode structure is designed and steady-state electrical characteristics are simulated. Single-event effects are simulated using an ion-strike modeled after data reported in the li...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2006
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-05312006-163349/ |