Cross-Layered Reliability Analysis of Object-Tracking Algorithms to Radiation-Induced Soft Errors
Hardware implementations of Object-Tracking Algorithms are susceptible to radiation-induced soft errors. The thesis analyzes the results of fault emulation experiments conducted on register-transfer level on a field programmable gate array (FPGA) implementation of object tracking. Typical single eve...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2017
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-03262017-152441/ |