Design of soft-error-aware sequential circuits with power and speed optimization
A single-event effect (SEE) of circuits is strongly dependent on the supply voltage and the physical capacitance. Reduction in supply voltage as well as technology scaling trends (smaller nodal capacitances) may result in dramatically increased sensitivity of the circuits to radiation. For this reas...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2018
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-03192018-153616/ |