FAULT DE-INTERLEAVING FOR RELIABILITY IN HIGH-SPEED CIRCUITS
The majority of modeling and simulation of single event transients (SETs) and their effects is normally done at a transistor level, known as micro-modeling. These simulations give insight into how a transistor will behave when struck by SETs. The micro-modeling of single-particle effects in Integrat...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2011
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-02242011-141755/ |