EFFECTS OF SINGLE-EVENT-INDUCED CHARGE SHARING IN SUB-100 NM BULK CMOS TECHNOLOGIES
Sub-100 nm technologies are more vulnerable than older technologies to single event effects (SEE) due to Moore's Law scaling trend. The increased SEE vulnerability has been attributed to the decrease in nodal charge for information storage, reduced nodal separation, and increased switching freq...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2009
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-02162009-141344/ |