System level methodology for low cost performance characterization of analog and mixed-signal circuits
Conventionally, the performances of Analog and Mixed-Signal (AMS) circuits have been characterized using specification-based functional tests. In these test methods, the correct functionalities of AMS circuits are verified by measuring pre-determined specification parameters of AMS circuits. The con...
| Main Author: | |
|---|---|
| Format: | Others |
| Language: | English |
| Published: |
2009
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/2152/6582 |